The CETCOR has been designed for the compensation of spherical aberration (Cs) in high-resolution transmission electron microscopes (TEM). The corrector compensates all aberrations up to including 3rd order (A1, B2, A2, C3, S3, A3).
The CETCOR can be used variably with accelerating voltages between 30 kV and 300 kV.
Due to the correction of image aberrations the point resolution can be matched to the information limit of the TEM. In modern field emission TEMs, the use of a corrector can improve the point resolution by a factor of two compared to the uncorrected TEM.
In combination with a monochromized electron gun an information limit of 80 pm (at 200 kV) and 50 pm (at 300 kV) can be reached.
The CETCOR is especially suitable for atomic scale resolution TEM of material science applications in the nano sciences.
Hexapole-type Cs-corrector for high-resolution TEM
Auto-correction of all axial aberrations up to including 3rd order (A1, B2, A2, C3, S3, A3)
Vanishing delocalization in the image
Improved point resolution
The combination with a monochromator improves the information limit to 80 pm at 200kV and to 50 pm at 300kV.
Compatible with many TEMs: TFS (Tecnai F20, Titan, Themis und Spectra), JEOL (JEM-2100F, JEM-2200FS, JEM-ARM200F und JEM-ARM200F NEOARM), Zeiss (Libra 200)
Device dimensions: 250 x 396 x 306 [mm]
Microscopy mode: TEM
High voltage range: 30kV – 300kV
High resolution transmission electron microscopy, especially in the field of material science.
Do you have any questions about the product or the application and extension for your e-beam system? Please contact us at firstname.lastname@example.org
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