Cs-corrected transmission microscopy shows a point resolution of the same size as the information limit of the microscope. Therefore, no artefacts or delocalization effects are observed in phase contrast imaging of non periodic regions of the specimen. First applications utilizing this advantage have been carried out at the Forschungszentrum in Jülich using the development prototype of CEOS's corrector.
Meanwhile the Ernst Ruska Center in Jülich has the widest experience in the application of a corrected TEM. Exciting new results with the prototype corrector like the direct visualization of oxygen atoms have been published by the Jülich group. Some interesting pictures obtained at the Ernst Ruska Center can be found here.
We have published a paper about the correction capabilities of the corrector and about the correction of fifth-order spherical aberration (C5) at the EMC 2004 at Antwerp. Read the excerpt of the results!
Cs-Correctors are now available for most of the high-end TEM's and STEM's. The major suppliers of these instruments have all reported sub-Ångstrøm resolution in their instruments. For details, plese consult the following links (listing in alphabetic order):
Please contact the microscope manufacturers for a quotation, q.v. links.